著者

橋本 翼 横山 武司 田中 良和

出版者

日本結晶学会

雑誌

日本結晶学会誌 (ISSN:03694585)

巻号頁・発行日

vol.63, no.2, pp.89-96, 2021-05-31 (Released:2021-06-05)

参考文献数

30

被引用文献数

1

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Recent marked development called “Resolution revolution” has made cryo-electron microscopy (Cryo-EM) the third method of structure determination at atomic resolution next to X-ray crystallography and NMR. In this review, actual situation surrounding Cryo-EM including an outline about the workflow from sample preparation to image analysis and differences between Cryo-EM analysis and X-ray crystallography is introduced. We hope that this review is useful for researchers particularly who will start Cryo-EM analysis.