著者

米倉 功治

出版者

日本結晶学会

雑誌

日本結晶学会誌 (ISSN:03694585)

巻号頁・発行日

vol.63, no.3, pp.189-196, 2021-08-31 (Released:2021-09-02)

参考文献数

49

---

The scattering powers of electron and X-ray differ by 4 - 5 orders of magnitude. Thanks to this property, the electron beam yields high-resolution diffraction spots from undersized crystals of various samples, which are hard to grow to a suitable size for X-ray diffraction even with a high-intensity synchrotron radiation beam. Thus, the technique known as electron 3D crystallography/3D ED/MicroED is recognized as being important especially in synthetic chemistry, material sciences and related areas, while single particle analysis can be used for larger-sized proteins. Here I review this technology including our recent developments and results.