著者

古賀 三井 蔵元 英一 佃 昇

出版者

九州大学大学院総合理工学研究科

雑誌

九州大学大学院総合理工学報告 (ISSN:03881717)

巻号頁・発行日

vol.21, no.4, pp.333-336, 2000-03

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In order to investigate the time dependent material structure the time-resolved x-ray diffractometry with a position sensitive detector(PSD)has so far been used. But this method is not so effective to the precise lattice parameter measurement, because of low angular resolution of the detector. In the present study, therefore, the development of the time-resolved x-ray diffractometry by the angular scanning with a scintillation counter (SC) has been attempted. Lattice parameter measurements of highly oriented pyrolytic graphite(HOPG)during rapid heating and cooling have been examined by both methods. As a result, the angular scanning method can realize more precise measurement than that of PSD method. From this result it was clarified that SC method is more suitable than the PSD method for the precise detection of the structure change of materials.