著者

中村 基訓 木村 道哉 末岡 和久 武笠 幸一

出版者

公益社団法人 日本磁気学会

雑誌

日本応用磁気学会誌 (ISSN:02850192)

巻号頁・発行日

vol.24, no.4_2, pp.771-774, 2000 (Released:2007-02-26)

参考文献数

14

被引用文献数

2 2

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A variety of techniques have been proposed to measure surface magnetic properties using scanning probe microscopy. The most widely used is magnetic force microscopy (MFM). In many cases, however, it is hard to analyze MFM data quantitatively. A magnetoresistive (MR) device is also a candidate for such a sensor that can operate at room temperature with high sensitivity. Yamamoto et al. have demonstrated a scanning magnetoresistance microscope (SMRM) using a commercially available MR read-head for a hard disk. Since they held the MR head on a slider, there was no feedback system to control the distance between sample and sensor. We made a cantilever for the MR sensor to get the surface topography and magnetic properties simultaneously. Its magnetic field sensitivity with 10-mA sensing current is 90 μV/Oe, and our roughly estimated minimum field resolution is a few mOe (only Johnson noise is assumed with 10-kHz bandwidth at room temperature), which is much better than that of a scanning Hall probe microscope.