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2 0 0 0 OA Hot-Carrier Reliability of 0.1 μm Delta-Doped MOSFETs

著者
Kenji NODA Tetsuya UCHIDA Toru TATSUMI Chenming HU
出版者
The Japan Society of Applied Physics
雑誌
1995 International Conference on Solid State Devices and Materials
巻号頁・発行日
2015-11-09