著者

Tsukuda M. Abe S. Hasegawa K. Ninomiya T. Omura I.

出版者

Elsevier

雑誌

Microelectronics Reliability (ISSN:00262714)

巻号頁・発行日

vol.88-90, pp.482-485, 2018-09-30

被引用文献数

3

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In this paper, we propose the criteria of bias voltage from parasitic capacitance and demonstrate the criteria in an experiment with the present IGBT. The bias voltage criteria are theoretically predicted for the new generation IGBT based on the scaling principle. For safe switching, the required gate voltage bias is predicted to be −1.2V or less for the present IGBTs and −6V or less is required to completely cancel the gate noise voltage. From the IGBT design, the bias voltage of scaling IGBT requires −2V to completely cancel the gate noise voltage.