A Study on Time Dependent Variations Caused Rare-Event Fail Bit Count Prediction Analysis Methods for Nano-Meter Scaled SRAM Reliability Designs - 文献詳細 - Ceek.jp Altmetrics

4 0 0 0 OA A Study on Time Dependent Variations Caused Rare-Event Fail Bit Count Prediction Analysis Methods for Nano-Meter Scaled SRAM Reliability Designs

著者: Somha Worawit
出版者: 福岡工業大学
巻号頁・発行日: 2015-04-06

2021-02-14 08:12:56
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http://hdl.handle.net/11478/165

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Dr. Thetis Sohma Worawit https://t.co/77dxopzpdo #山内寛行　＃アドバイザー　＃博士論文

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