著者

佐藤 眞直

出版者

日本結晶学会

雑誌

日本結晶学会誌 (ISSN:03694585)

巻号頁・発行日

vol.56, no.4, pp.259-262, 2014-08-31 (Released:2014-09-03)

参考文献数

6

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X-ray diffraction technique is suitable for in-situ observation and quantitative analysis of phenomena occurring in manufacturing process of industries. Its time resolution has been progressed by applying synchrotron radiation. Two cases of industrial application of synchrotron radiation are introduced.