1 0 0 0 OA カソードルミネッセンス顕微法による格子欠陥の観察
- 著者
- 山本 直紀
- 出版者
- The Crystallographic Society of Japan
- 雑誌
- 日本結晶学会誌 (ISSN:03694585)
- 巻号頁・発行日
- vol.27, no.1, pp.12-22, 1985-01-30 (Released:2010-09-30)
- 参考文献数
- 37
- 被引用文献数
- 1
Cothordoluminescence (CL) detection system was built up for a transmission electron microscope with scanning units, which enable us to take high-resolution CL images of crystal defects together with crystallographic information. Luminescence or non-luminescence centers localized at dislocations in III-V compound semiconductors, diamond and magnesium oxide were observed using this system. Their natures were studied through the analyses of the TEM and monochromatic CL images and spectral information of the CL light.
1 0 0 0 OA 電子回折図形を見てみよう
- 著者
- 山本 直紀
- 出版者
- The Crystallographic Society of Japan
- 雑誌
- 日本結晶学会誌 (ISSN:03694585)
- 巻号頁・発行日
- vol.39, no.4, pp.279-288, 1997-08-30 (Released:2010-09-30)
This article gives fundamentals of analyzing electron diffraction patterns for persons who start to use an transmission electron microscope.