- 著者
- 北野 誠 西村 朝雄 河合 末男
- 出版者
- 一般社団法人 日本機械学会
- 雑誌
- 日本機械学会論文集 A編 (ISSN:03875008)
- 巻号頁・発行日
- vol.57, no.538, pp.1398-1405, 1991-06-25 (Released:2008-02-21)
- 参考文献数
- 5
- 被引用文献数
- 2 1
The plastic packages of ICs have been changing from insertion types to surface mounted types. Reflow soldering is used for surface mounted ICs onto printed circuit boards. During this process, packages are heated to above 200°C. If the encapsulant absorbs moisture, package cracking may occur during the reflow soldering. It is known that the cracks are caused by vapor pressure generated inside the packages, causing excessive stress in the plastic. In the former report, moisture diffusion analysis in the plastic was performed and vapor pressure could be obtained. Since the edge tip of the chip pad where package cracking occurs is a singular point within the elastic stress field, strength evaluation for package cracking is not established. In this study, the quantitative strength evaluation of the plastic is investigated by using the stress singularity theory.
1 0 0 0 半導体パッケージの構造設計CAEシステムの開発
- 著者
- 小島 清美 寺崎 健 三浦 英生 西村 朝雄
- 出版者
- 一般社団法人日本機械学会
- 雑誌
- 日本機械学會論文集. A編 = Transactions of the Japan Society of Mechanical Engineers. A (ISSN:03875008)
- 巻号頁・発行日
- vol.69, no.686, pp.1409-1414, 2003-10-25
- 参考文献数
- 20
A practical structural design system for LSI packages has been developed based on object oriented and graphical user interface technologies. An object-oriented technology is applied for creating product model-based analytical model (PBAM) which is independent of analytical method or tool. It is easy to create any CAE model from the PBAM. Graphical user interface is another effective technology for easy operation. Design engineers only have to select a model of interest and revise the dimensions or materials of the package, if necessary. As soon as they finish revising the input data, a CAE model such as finite element meshes are generated and the analysis starts automatically. The life of the solder joints, for example, is automatically evaluated and the results are displayed on a CRT. This system is very effective for designing new, highly reliable LSI packages in a short time.