著者

阿部 英司

出版者

日本結晶学会

雑誌

日本結晶学会誌 (ISSN:03694585)

巻号頁・発行日

vol.62, no.4, pp.248-252, 2020-12-22 (Released:2020-12-26)

参考文献数

32

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I will describe the future direction of electron crystallography, by focusing on how electron beams contribute uniquely for atomic structure determinations. Both for electron diffraction and microscopy, the key lies on how we make the best use of dynamical scattering effects, which are significant for electrons compared with other probes including X-ray.