著者
Islam M. M. Yamada A. Sakurai T. Kubota M. Ishizuka S. Matsubara K. Niki S. Akimoto K.
出版者
American Institute of Physics
雑誌
Journal of applied physics (ISSN:00218979)
巻号頁・発行日
vol.110, no.1, pp.014903, 2011
被引用文献数
8 6

The Cu-dependent phase transition in polycrystalline CuGaSe2 thin films has been studied by an electron probe micro-analyzer (EPMA) and the synchrotron x-ray diffraction method. A Cu-deficiency parameter, Z, defined as (1 − Cu/Ga) was used to study the phase transition. Upon increasing the Z-value, the composition of the films on the Cu2Se-Ga2Se3 pseudo binary tie line was found to shift from the stoichiometric CuGaSe2 (1:1:2) (Z = 0) to the Ga-rich composition through the formation of several ordered defect compounds.The structural modification in the Cu-poor CuGaSe2 film has been investigated by the synchrotron x-ray diffraction method. The existence of the Cu-poor surface phase over the near-stoichiometric bulk CuGaSe2 film was confirmed by the fitting of the accelerated voltage dependent EPMA data.
著者
Aoki M. Toyoshima S. Kamada T. Sogo M. Masuda S. Sakurai T. Akimoto K.
出版者
American Institute of Physics
雑誌
Journal of applied physics (ISSN:00218979)
巻号頁・発行日
vol.106, no.4, pp.043715, 2009-08
被引用文献数
11 7

Electron emission spectra resulting from thermal collision of He*(23S) atoms with 2,9-demethyl-4,7-diphenyl-1,10-phenanthroline (BCP) films deposited on metal substrates were measured to characterize gap states emerged at the organic-metal interface. For BCP on Au, the gap state is originated from weak chemisorption and serves as a mediator of metal wave functions to the first layer. For BCP on K, organic-metal complex is formed by spontaneous diffusion, yielding the gap states delocalized over the film. In the interfacial region, all the gap state reveals an incommensurate shift with the valence band top of the film, indicating the breakdown of the Schottky–Mott model as evaluating the transport characteristics in organic-metal system.
著者
Paul G. K. Nawa Y. Sato H. Sakurai T. Akimoto K.
出版者
American Institute of Physics
雑誌
Applied physics letters (ISSN:00036951)
巻号頁・発行日
vol.88, no.14, pp.141901, 2006-04
被引用文献数
88 41

Hole traps in p-type Cu2O were studied by means of deep level transient spectroscopy in the heterostructure of p-Cu2O/i-ZnO/n-ZnO. In addition to the trap level at about 0.45 eV from the valance band edge, which is already reported as being due to Cu vacancy, we found a new trap level at about 0.25 eV. The new trap is tentatively assigned as Cu-di-vacancy from the trap concentration dependence on oxygen flow rate and substrate temperature.