著者

Jin-Taek SEONG

出版者

The Institute of Electronics, Information and Communication Engineers

雑誌

IEICE Transactions on Information and Systems (ISSN:09168532)

巻号頁・発行日

vol.E103.D, no.5, pp.1164-1167, 2020-05-01 (Released:2020-05-01)

参考文献数

15

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The aim of this paper is to show an upper bound for finding defective samples in a group testing framework. To this end, we exploit minimization of Hamming weights in coding theory and define probability of error for our decoding scheme. We derive a new upper bound on the probability of error. We show that both upper and lower bounds coincide with each other at an optimal density ratio of a group matrix. We conclude that as defective rate increases, a group matrix should be sparser to find defective samples with only a small number of tests.