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3 0 0 0 OA Recent progresses in nanometer scale analysis of buried layers and interfaces in thin films by X-rays and neutrons

著者
Krassimir Stoev Kenji Sakurai
出版者
The Japan Society for Analytical Chemistry
雑誌
Analytical Sciences (ISSN:09106340)
巻号頁・発行日
pp.19R010, (Released:2020-03-06)
被引用文献数
7