著者

Shin-Ichiro Hayashi Keiji Wada

出版者

The Institute of Electrical Engineers of Japan

雑誌

IEEJ Journal of Industry Applications (ISSN:21871094)

巻号頁・発行日

vol.11, no.1, pp.108-116, 2022-01-01 (Released:2022-01-01)

参考文献数

26

被引用文献数

7

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This study presents a design method for the continuous switching test circuits of power devices. Depending on the relationship between the rated voltage of a DC voltage source and device under test (DUT), two types of test circuits are proposed. These test circuits comprise a cascaded buck-boost (or boost-buck) converter to achieve power regeneration. Based on analysis of the test circuits, a design method is proposed to ensure that any failure does not spread to the test circuit even when the DUT fails during the continuous switching tests. A test circuit is designed according to the proposed method, and its experimental results demonstrate the validity of the proposed design.