著者

Lee J. D. Nagatomi T. (Translator) Mizutani G. (Translator) Endo K. (Translation Supervisor)

出版者

Surface Analysis Society of Japan

雑誌

Journal of Surface Analysis (ISSN:13411756)

巻号頁・発行日

vol.17, no.2, pp.64-86, 2010-12

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The angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental tool to probe themomentum-resolved electronic structure, i.e., the electronic band dispersion ε(k), of solids and their surfaces. ARPES is also an ideal tool to address the question concerning the electron correlation effect on quasiparticle excitations in the low-dimensional (one- or two-dimensional) correlated electron systems. In this issue, we briefly introduce representative studies of ARPES and their fruitfulness from the free-electron-like three-dimensional systems to the low-dimensional strongly correlated electron systems. : 角度分解光電子分光法(ARPES)は,固体とその表面の電子構造の運動量依存性,すなわち電子構造のバンド分散 ε(k)を測定する有力な実験手法である.ARPES は低次元(一次元あるいは二次元)相関電子系における準粒子励起における電子相関の影響を調べるための理想的な手法でもある.本稿では,自由電子的な三次元系から低次元強相関電子系までの系に対するARPES の代表的な研究とその有効性について概説する.