著者

加藤 秀起 津坂 昌利 小山 修司 前越 久

出版者

公益社団法人 日本放射線技術学会

雑誌

日本放射線技術学会雑誌 (ISSN:03694305)

巻号頁・発行日

vol.54, no.5, pp.615-623, 1998

参考文献数

16

被引用文献数

1 1

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An x-ray spectrum measured by a semiconductor detector is different from the incident x-ray spectrum to the detector, because of distortions caused by energy-dependent responses of the detector and statistical and electrical fluctuations in the signal amplifying process. In this paper, we discuss a method for correcting the statistical and electrical fluctuations of the x-ray spectrum, using the unfolding method with a function based on the Gaussian distribution. Unfolding the measured x-ray spectrum by this method, K-α and K-β characteristic x-rays were clearly separated into two line spectra, and energy resolution was improved. The unfolding method, when used to supplement the stripping method that is generally applied to x-ray spectra correction, will provide enhanced correction of x-ray spectra.