- 著者
-
奥村 哲平
増井 博一
豊田 和弘
趙孟 佑
今泉 充
- 出版者
- 一般社団法人 日本航空宇宙学会
- 雑誌
- 日本航空宇宙学会論文集 (ISSN:13446460)
- 巻号頁・発行日
- vol.55, no.647, pp.590-596, 2007 (Released:2007-12-27)
- 参考文献数
- 14
- 被引用文献数
-
6
7
Electrostatic discharge (ESD) occurs on the solar array due to space plasma interaction. It is considered that solar cell suffers degradation of electric performance, once ESD occurs at the solar cell edge. In order to study the degradation of solar cell electrical performance, we performed ESD tests on Si solar cell in a vacuum chamber. After the ESD tests the solar cell maximum power decreased. We found the damage on surface electrode in the vicinity of ESD spot. Infrared emission due to current leak was found at the spot. The solar cell degraded due to the leak resistance produced by ESD.