著者

近藤 陽介 泉地 正人 山本 貴生 平野 尚彦

出版者

一般社団法人 電気学会

雑誌

電気学会論文誌D(産業応用部門誌) (ISSN:09136339)

巻号頁・発行日

vol.133, no.5, pp.510-517, 2013-05-01 (Released:2013-05-01)

参考文献数

13

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This paper provides a new method to estimate very high frequency (VHF) conducted noise from power electronic devices using numerical analysis. The switching waveforms generated by power semiconductor devices, which are the main noise sources, are calculated by a circuit simulation that uses semiconductor device models. The transfer functions from noise sources to voltage measurement points are calculated by the S-parameters on a power electronic device. The S-parameters are calculated by a 3D electromagnetic simulator. The combined results of circuit simulation and electromagnetic analysis create a good correlation with the actual experimental result in the frequency range of 200MHz and below.