著者

音川英一

雑誌

電子情報通信学会

巻号頁・発行日

vol.23, no.1, pp.103-106, 2003

被引用文献数

1

著者

音川 英一 早野 誠治 齋藤 兆古 堀井 清之

出版者

社団法人 可視化情報学会

雑誌

可視化情報学会誌 (ISSN:09164731)

巻号頁・発行日

vol.24, no.Supplement1, pp.255-258, 2004-07-01 (Released:2009-07-31)

参考文献数

8

被引用文献数

1

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With the developments of modern high-speed computer, X-ray tomography and MRI are widely used as a deterministic tool of medical diagnosis. On the other side, EIT (Electrical Impedance Tomography) is now developing mainly for industrial use. Fundamental difference between them is that MRI or X-ray tomography needs not to handle the functional measured data, but EIT is based on the functional nature of the measurable data. Namely, EIT requires a solution of ill-posed system equations but MRI or X-ray tomography does not require the solution of such the ill-posed system equations. In the present paper, we propose one of the most reliable solution methodologies accompanying with EIT development.