著者

白松 利也 栗田 昌幸 三宅 晃司 SUK Mike 大木 聡 田中 秀明 三枝 省三

出版者

一般社団法人日本機械学会

雑誌

年次大会講演論文集 : JSME annual meeting

巻号頁・発行日

vol.2005, no.5, pp.285-286, 2005-09-18

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In order to realize ultra-low flying heights, magnetic spacing variations due to manufacturing tolerances, environmental variations, and write-induced thermal protrusion need to be reduced. To decrease the flying height, we have developed a thermal flying-height control (TFC) slider that carries a micro-thermal actuator. Using the device, the magnetic spacing of these sliders can be controlled in-situ during operation of the drive. First prototype had shown insufficient characteristics when evaluated at a component-level prototype. Therefore, the purpose of this research is to verify drive-level feasibility and better actuator characteristics. After analytical design by simulation of heat transfer and thermal deformation, second type of TFC device was fabricated. Component level evaluation showed sufficient actuator characteristics that met the requirements leading to the development of drives with controllable flying-height sliders. Drive level evaluation showed its effectiveness in reducing the magnetic spacing.

著者

栗田 昌幸 白松 利也 三宅 晃司 加藤 篤 曽我 政彦 田中 秀明 三枝 省三 SUK Mike

出版者

一般社団法人日本機械学会

雑誌

年次大会講演論文集 : JSME annual meeting

巻号頁・発行日

vol.2005, no.5, pp.283-284, 2005-09-18

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Today's head/disk interface design has a wide flying height distribution due to manufacturing tolerances, environmental variations, and write-induced thermal protrusion. To reduce the magnetic spacing loss due to these effects, we have developed an active head slider with nano-thermal actuator. The magnetic spacing of these sliders can be controlled in-situ during operation of the drive. After simulating the heat transfer in the slider and resulting thermal deformation of the air-bearing surface, we fabricated a thermal actuator by thin film processing. The evaluation by a read/write tester showed a linear reduction in magnetic height as electric power was applied to the actuator. The actuator's stroke was 2.5nm per 50mW with time constant of 1 msec. We found no significant impact to the reliability of the read element.