著者

木本 浩司

出版者

日本結晶学会

雑誌

日本結晶学会誌 (ISSN:03694585)

巻号頁・発行日

vol.61, no.1, pp.15-22, 2019-02-28 (Released:2019-03-02)

参考文献数

32

被引用文献数

2

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Crystal structure analysis using scanning transmission electron microscopy(STEM)is briefly reviewed. The various imaging techniques, such as bright field(BF), annular BF(ABF)and annular dark-field(ADF)are presented. Recent progress in STEM imaging is also described.