- 著者
-
木本 浩司
- 出版者
- 日本結晶学会
- 雑誌
- 日本結晶学会誌 (ISSN:03694585)
- 巻号頁・発行日
- vol.61, no.1, pp.15-22, 2019-02-28 (Released:2019-03-02)
- 参考文献数
- 32
- 被引用文献数
-
2
Crystal structure analysis using scanning transmission electron microscopy(STEM)is briefly reviewed. The various imaging techniques, such as bright field(BF), annular BF(ABF)and annular dark-field(ADF)are presented. Recent progress in STEM imaging is also described.