Microscopic FCA system for carrier lifetime measurement in SiC with high spatial resolution

著者: Keisuke Nagaya Takashi Hirayama Takeshi Tawara Koichi Murata Hidekazu Tsuchida Akira Miyasaka Kazutoshi Kojima Tomohisa Kato Hajime Okumura Masashi Kato
出版者: ICSCRM2019 Organizing Committee
雑誌: International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM2019)
巻号頁・発行日: 2019-07-19

我々のレイトニュースペーパーもう一件は高空間分解能キャリアライフタイム測定のオーラルプレゼンテーションです https://t.co/wNcS7IpNbd https://t.co/Ym4B72zF0h

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