5 0 0 0 OA 炭素12のモル質量は12 gではなくなりました
- 著者
- 浅川 大樹
- 出版者
- 一般社団法人 日本質量分析学会
- 雑誌
- Journal of the Mass Spectrometry Society of Japan (ISSN:13408097)
- 巻号頁・発行日
- vol.71, no.1, pp.34-35, 2023-03-01 (Released:2023-03-15)
- 参考文献数
- 5
1 0 0 0 OA エレクトロスプレー帯電液滴衝撃二次イオン質量分析法
- 著者
- 浅川 大樹 森 邦彦 平岡 賢三
- 出版者
- 日本質量分析学会
- 雑誌
- Journal of the Mass Spectrometry Society of Japan (ISSN:13408097)
- 巻号頁・発行日
- vol.55, no.3, pp.127-135, 2007 (Released:2007-06-15)
- 参考文献数
- 35
- 被引用文献数
- 4 4
A new ionization method, electrospray droplet impact ionization (EDI), has been developed for matrix-free secondary-ion mass spectrometry (SIMS). The charged droplets formed by electrospraying 1 M acetic acid aqueous solution are sampled through an orifice with a diameter of 400 μm into the first vacuum chamber, transported into a quadrupole ion guide, and accelerated at 10 kV after exiting the ion guide. The droplets impact on a dry solid sample (no matrix used) deposited on a stainless steel substrate. The secondary ions formed by the impact are transported to a second quadrupole ion guide and are mass-analyzed by an orthogonal time-of-flight mass spectrometer. EDI/SIMS was found to be an easy to operate and versatile method for molecular-level surface analysis.