著者

高元 曄夫

出版者

公益社団法人 応用物理学会

雑誌

応用物理 (ISSN:03698009)

巻号頁・発行日

vol.25, no.7, pp.283-289, 1956-07-10 (Released:2009-02-09)

参考文献数

12

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By means of the probe method (1) the distribution of resistance in a coating layer, (2) Iemission-Vprove characteristics and (3) the grid action of the probe are studied. Ex-perimental results show that the resistance near the emitting surface is a few times higher than the resistance of the inner bulk oxide while the resistance of the interface layer is not so high. Thus the substantial potential drop is supposed to exist near the emitting surface. At a large anode current, the potential drop across the coating layer becomes extremely high by the poisoning of gas released slightly from the plate leading to the thermal breakdown near the emitting surface. Cathode sparking of a diode often experienced in the earlier stage of working may perhaps be such type of breakdown.