著者
Umeda T. Isoya J. Morishita N. Ohshima T. Kamiya T. Gali A. Deák P. Son N. T. Janzén E.
出版者
American Physical Society
雑誌
Physical review B (ISSN:10980121)
巻号頁・発行日
vol.70, pp.235212, 2004-12
被引用文献数
49

The carbon vacancy is a dominant defect in 4H-SiC, and the "EI5" electron-paramagnetic-resonance (EPR) spectrum originates from positively charged carbon vacancies (VC+) at quasicubic sites. The observed state for EI5, however, has been attributed to a motional-averaged state with the C3v symmetry, and its true atomic structure has not been revealed so far. We here report low temperature (<40 K) EPR measurements on EI5 and show that this center has a C1h-symmetric structure due to Jahn-Teller distortion. We also performed ab inito calculations of the hyperfine tensors for EI5, and obtained a good agreement between experiment and theory in not only their principal values but also their principal axis directions. A good agreement was also demonstrated for the EI6 center (hexagonal-site VC+) in this paper. The transition from EI5(C1h) to EI5(C3v) was found to be thermally activated and its activation energy was measured as 0.014 eV.
著者
Umeda T. Ishitsuka Y. Isoya J. Son N. T. Janzén E. Morishita N. Ohshima T. Itoh H. Gali A.
出版者
American Physical Society
雑誌
Physical review B (ISSN:10980121)
巻号頁・発行日
vol.71, pp.193202, 2005-05
被引用文献数
55

Carbon vacancies (VC) are typical intrinsic defects in silicon carbides (SiC) and so far have been observed only in the form of positively charged states in p-type or semi-insulating SiC. Here, we present electron-paramagnetic-resonance (EPR) and photoinduced EPR (photo-EPR) observations of their negatively charged state (V<sub>C</sub><sup>-</sup>) in n-type 4H-SiC. This EPR center (called HEI1) is characterized by an electron spin of 1/2 in a Si-Si antibonding state of VC. First-principles calculations confirm that the HEI1 center arises from V<sub>C</sub><sup>-</sup> at hexagonal sites. The HEI1 spectrum shows a transition between C1h and C3v symmetries due to a fast reorientation effect reflected in the nature of this defect. The photo-EPR data suggest that V<sub>C</sub><sup>2-</sup> is the dominant form of VC when the Fermi level lies 1.1 eV below the conduction band.
著者
Umeda T. Son N. T. Isoya J. Janzén E. Ohshima T. Morishita N. Itoh H. Gali A. Bockstedte M.
出版者
American Physical Society
雑誌
Physical review letters (ISSN:00319007)
巻号頁・発行日
vol.96, pp.145501, 2006-04
被引用文献数
70

The metastability of vacancies was theoretically predicted for several compound semiconductors alongside their transformation into the antisite-vacancy pair counterpart; however, no experiment to date has unambiguously confirmed the existence of antisite-vacancy pairs. Using electron paramagnetic resonance and first principles calculations we identify the SI5 center as the carbon antisite-vacancy pair in the negative charge state (CSiV<sub>C</sub><sup>-</sup>) in 4H-SiC. We suggest that this defect is a strong carrier-compensating center in n-type or high-purity semi-insulating SiC.