著者

原木 寛司 蓮沼 宏

出版者

公益社団法人 応用物理学会

雑誌

応用物理 (ISSN:03698009)

巻号頁・発行日

vol.30, no.10, pp.742-744, 1961-10-10 (Released:2009-02-09)

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Phase lag of light wave by reflection on Ag thin films is measured from the shift of interference fringes. The results agree with those calculated theoretically. Phase lag of thin films thinner than 300 Å differs from that of bulk metal and the calculated maximum phase difference of 0.41 rad. occurs when the film thickness is 40Å.