著者

栗田 隆治 蓮沼 宏

出版者

公益社団法人 応用物理学会

雑誌

応用物理 (ISSN:03698009)

巻号頁・発行日

vol.28, no.9, pp.539-544, 1959-09-10 (Released:2009-02-09)

参考文献数

4

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The growth of low refractive index layer (L. I. layer) on the surface of optical grass in SiO2-water or alkali solution is studied in detail. The amount of glass dissolved is measured by multiple beam interferometry. The thickness (d) and the refractive index (n) of the layer are measured by polarimetric method. In the cases of SK 16 and SSK 5, thick growth of L. I. layer is observed in SiO2-water solution. SF 3 and BK 7 are hardly affected by the presence of SiO2 in neutral solution. But in con-centrated SiO2-alkali solution the growth of L. I. layer is observed on the surface of BK 7 as well as SF 3. BK 7 is a durable glass against acids and alkalis. The largest thickness of the L. I. layer observed is about 600 A. A definite value of the refractive index of the surface layer on BK 7 is not obtained. In this case, the growth of L. I. layer is expressed by the fall of the refractive index of the layer together with the thickness.

著者

荒 哲哉 石黒 浩三 大上 進吾 小倉 磐夫 小瀬 輝次 田幸 敏治 蓮沼 宏 藤野 米吉 松居 吉哉 三宅 和夫 宮田 尚一

出版者

公益社団法人 応用物理学会分科会 日本光学会

雑誌

光学ニュース (ISSN:18839665)

巻号頁・発行日

vol.1971, no.118, pp.19-28_1, 1971-12-10 (Released:2010-11-17)

著者

原木 寛司 蓮沼 宏

出版者

公益社団法人 応用物理学会

雑誌

応用物理 (ISSN:03698009)

巻号頁・発行日

vol.30, no.10, pp.742-744, 1961-10-10 (Released:2009-02-09)

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Phase lag of light wave by reflection on Ag thin films is measured from the shift of interference fringes. The results agree with those calculated theoretically. Phase lag of thin films thinner than 300 Å differs from that of bulk metal and the calculated maximum phase difference of 0.41 rad. occurs when the film thickness is 40Å.