著者

森川 大輔 津田 健治

出版者

日本結晶学会

雑誌

日本結晶学会誌 (ISSN:03694585)

巻号頁・発行日

vol.63, no.2, pp.135-142, 2021-05-31 (Released:2021-06-05)

参考文献数

36

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Convergent-beam electron diffraction (CBED) is one of the powerful tools for nano-meter scale structural analysis. From its specific futures such as nano-meter probe, dynamical scattering, and direct determination of electrostatic potential, CBED can be applied for space group determination, observation of orbital-ordered state, and local structure analysis. In this paper, some examples for recent results obtained by CBED method are described.