- 公益社団法人 応用物理学会
- 応用物理 (ISSN:03698009)
- vol.34, no.11, pp.782-794, 1965-11-10 (Released:2009-02-09)
After describing briefly the principle and techniques of ellipsometry, the authors review the recent developments in ellipsometric studies of films and surfaces with comments on future possibilities. The items covered are: determination of optical constants, observation of transition layers, adsorption studies, work on oxidation and corrosion of solid surfaces, and others.