- 著者
-
橋本 翼
横山 武司
田中 良和
- 出版者
- 日本結晶学会
- 雑誌
- 日本結晶学会誌 (ISSN:03694585)
- 巻号頁・発行日
- vol.63, no.2, pp.89-96, 2021-05-31 (Released:2021-06-05)
- 参考文献数
- 30
- 被引用文献数
-
1
Recent marked development called “Resolution revolution” has made cryo-electron microscopy (Cryo-EM) the third method of structure determination at atomic resolution next to X-ray crystallography and NMR. In this review, actual situation surrounding Cryo-EM including an outline about the workflow from sample preparation to image analysis and differences between Cryo-EM analysis and X-ray crystallography is introduced. We hope that this review is useful for researchers particularly who will start Cryo-EM analysis.