著者
小野 眞 岩田 尚史 馬場 毅 金子 俊一
出版者
一般社団法人 電気学会
雑誌
電気学会論文誌C(電子・情報・システム部門誌) (ISSN:03854221)
巻号頁・発行日
vol.130, no.8, pp.1404-1410, 2010-08-01 (Released:2010-08-01)
参考文献数
21

Control charts are widely applied to monitoring quality variation from stable status to instable status in many manufacturing lines. Large-scale integrated circuit(LSI) manufacturing requires to monitor thin film thicknesses, circuit pattern dimensions, particle count on a wafer and so on. This paper proposes a new monitoring method for particles on a wafer. If particles induce random location based on Poison distribution, the c-chart is applicable. However, actual particle generation is not dependent of Poison distribution and then the c-chart indicates many false alarms. The proposed method predicts particle-limited yield to apply the p-chart to monitoring particle data. The method uses data outputted by a particle inspection tool such as a particle location and a scattered light intensity with respect to each particle. Experiments show that the method reduces false alarms.
著者
馬場 毅
出版者
早稲田大学史学会
雑誌
史観 (ISSN:03869350)
巻号頁・発行日
no.110, pp.p43-60, 1984-03
著者
馬場 毅
出版者
一般社団法人中国研究所
雑誌
中国研究月報 (ISSN:09104348)
巻号頁・発行日
vol.48, no.3, pp.29-40, 1994-03-25