1 0 0 0 逆空間に舞う花火
- 著者
- 小金澤 智之 安野 聡
- 出版者
- 公益社団法人 応用物理学会
- 雑誌
- 応用物理 (ISSN:03698009)
- 巻号頁・発行日
- vol.85, no.4, pp.257, 2016-04-10 (Released:2019-09-26)
1 0 0 0 OA 放射光を用いた有機薄膜成長の2次元X線回折その場観察
- 著者
- 吉本 則之 渡辺 剛 小金澤 智之 菊池 護 廣沢 一郎
- 出版者
- 公益社団法人 日本表面科学会
- 雑誌
- 表面科学 (ISSN:03885321)
- 巻号頁・発行日
- vol.35, no.4, pp.190-195, 2014-04-10 (Released:2014-04-22)
- 参考文献数
- 14
- 被引用文献数
- 1
Two-dimensional grazing incidence X-ray diffraction (2D-GIXD) is one of the powerful methods to analyze crystal growth and structure of organic thin films. In this report, we show some experimental examples of 2D-GIXD measurements on organic semiconductor thin-films performed at SPring-8. First, polymorphic transformation of pentacene depending on film thickness observed by means of in-situ real-time 2D-GIXD is shown. Secondly, real-time observation of change in structure during thin-film growth of oligothiophenes by means of 2D-GIXD is shown. Finally, a result of crystal structure analysis from 2D-GIXD data of polycrystalline an oligothiophene thin film is reported.