著者
服部 伴之 山口 哲央 間嶋 俊雄 寺嶋 和夫 吉田 豊信
出版者
公益社団法人 日本金属学会
雑誌
日本金属学会誌 (ISSN:00214876)
巻号頁・発行日
vol.63, no.1, pp.68-73, 1999
被引用文献数
3

Hot cluster epitaxy (HCE) is a novel high-rate epitaxial growth mechanism discovered in the study of the plasma flash evaporation method. In HCE, the main deposition species are thermally activated, nanometer-scale clusters (hot clusters), which have unique characteristics such as high internal energy and high sticking probability even at high substrate temperature. Actually, with HCE, deposition of YBa<SUB>2</SUB>Cu<SUB>3</SUB>O<SUB>7&minus;<I>x</I></SUB> epitaxial films at a growth rate of 16 nm/s on the SrTiO<SUB>3</SUB> substrate has been achieved. However, films thicker than 2 &mu;m could not be obtained so far. In this paper, we discuss the &ldquo;charge-up&rdquo; effect of clusters and insulating substrates in a plasma environment as a retarding factor for film growth. Probe measurements and the biasing deposition clarified the charge-up of clusters were charged up during deposition. It was found that more than 60% of the clusters were negatively charged. By using conductive substrates of Nb doped SrTiO<SUB>3</SUB>, or changing Ar composition in Ar-O<SUB>2</SUB> plasma, we could deposit monolayer-smooth epitaxial YBa<SUB>2</SUB>Cu<SUB>3</SUB>O<SUB>7&minus;<I>x</I></SUB> films thicker than 3 &mu;m, with excellent properties; the full width less than 0.14&deg; at half maximum of the X-ray rocking curve of the (005) peak, and the superconducting transition temperature of 92 K. These results suggest the future role of HCE in epitaxial thick film deposition.
著者
吉田 豊信 神原 淳 田中 康規 澁田 靖
出版者
東京大学
雑誌
基盤研究(S)
巻号頁・発行日
2009

ウエーハ等価薄膜太陽電池製造を可能とする次世代シーメンス法開発に向け,製造装置や安全性も考慮したプロセスの低コスト化等の技術開発研究と,成膜前駆体としてのクラスターの成長・堆積過程の解明や励起水素原子密度の絶対計測等の学術研究との融合知を礎としたシリコン膜堆積の系統的実験により,シーメンス法の速度論的限界を超えた高歩留まり超高速エピ堆積を実証するとともに,メゾプラズマCVD法の特徴を明確化した。