- 公益社団法人 日本表面真空学会
- 表面と真空 (ISSN:24335835)
- vol.61, no.10, pp.632-638, 2018-10-10 (Released:2018-10-10)
Frequency modulation atomic force microscopy (FM-AFM) can simultaneously detect the conservative and non-conservative force interactions between a tip and a sample, based on the resonance frequency shift (Δf) and the mechanical energy dissipation of an oscillating cantilever, respectively. Here, we outline the energy dissipation measured by FM-AFM and introduce our recent results obtained through measurement of the energy dissipation. First, surface resistances can be evaluated in non-contact using the proportional relationship between the energy dissipation due to Joule heat and Δf due to the electrostatic attractive force. Second, Si adatoms on a Si(111)-(7×7) surface, which are observed to be static by FM-AFM, can move back and force between their stable sites and their neighboring quasi-stable sites, detected by measuring of the energy dissipation.