著者
矢ヶ崎 克馬
出版者
日本共産党中央委員会
雑誌
前衛 (ISSN:13425013)
巻号頁・発行日
no.772, pp.114-125, 2004-02
著者
中島 篤之助
出版者
日本科学者会議
雑誌
日本の科学者 (ISSN:00290335)
巻号頁・発行日
vol.28, no.6, pp.p350-356, 1993-06
著者
中島 篤之助
出版者
新日本出版社
雑誌
季刊科学と思想 (ISSN:02877384)
巻号頁・発行日
no.72, pp.p1108-1130, 1989-04
著者
中島 篤之助
出版者
日本科学者会議
雑誌
日本の科学者 (ISSN:00290335)
巻号頁・発行日
vol.14, no.5, pp.p261-267, 1979-05
著者
中島 篤之助
出版者
岩波書店
雑誌
科学 (ISSN:00227625)
巻号頁・発行日
vol.49, no.5, pp.p314-324, 1979-05
著者
中島 篤之助 高橋 正雄 河口 広司
出版者
公益社団法人 日本金属学会
雑誌
日本金属学会誌 (ISSN:00214876)
巻号頁・発行日
vol.22, no.11, pp.564-568, 1958
被引用文献数
1

A method has been developed for the determination of rare earth elements including yttrium in uranium and its compounds. The greater portion of the uranium is separated from the rare earths by ether extraction. The rare earths are then precipitated as fluorides and subsequently purified as hydroxides. Lanthanum was used as the carrier. The efficiency of the above separation procedures was studied by means of the radioactive tracer Eu<SUP>152+154</SUP>. The final determination was carried out spectrographically by the copper-spark method. Five rare earth elements which showed extremely high neutron absorption were investigated, and their limits of detection (sensitivity) and recoveries from U<SUB>3</SUB>O<SUB>8</SUB> are reported.
著者
三橋 鐵太郎 中島 篤之助 白石 裕子
出版者
社団法人日本鉄鋼協会
雑誌
鐵と鋼 (ISSN:00211575)
巻号頁・発行日
vol.39, no.11, pp.1277-1281, 1953
被引用文献数
2

Apparatus of the high voltage a. c. arc source (4400-2A; 2200V-4A) as the light source of spectrographic analysis was designed and manufactured, and the quantitative spectrographic analysis of manganse, titanium, silicon, nickel, chromium, and arsenic in steel was carried out by it. It was ascertained that the quantitative analysis which hsd been impossible for small amount of the above elements in steel in the usual spark discharge method, became possible in high sensitivity and about 3-8 percent reproducibility by the above apparatus.<BR>As for the other characteristic, it was proved that there was practically no continuous background and few loss of testpieces on account of a lower temperature of the electrode.